Latest News

Press Release: Itech Electronics Found in Violation of Patent Infringement; Must Destroy Inventory

Itech Chroma infringement case
Itech shall immediately cease the manufacture, sale, and offering for sale of the products which infringe upon the invention patent rights of ChromaATE.

ChromaATE announces that on July 2, 2024, Itech Electronics (Nanjing) Co was adjudicated to be in violation of Patent Infringement on certain of Itech’s products per Article 67 of the People’s Republic of China patent law. Customers using or considering using those Itech products listed in the ruling are using products that infringe on Chroma’s patents.

In accordance with Article 2(2), Article 11(1), Article 64(1), Article 71, and Article 77 of Patent Law of the People’s Republic of China; Article 2 and Article 7 of Supreme People’s Court Interpretation on Several Issues Concerning the Application of Law in the Trial of Patent Infringement Dispute Cases; and Article 67 of Civil Procedure Law of the People’s Republic of China, the court ruled as follows:

Court Ruling:

Defendant Itech Electronics (Nanjing) Co., Ltd. shall immediately cease manufacturing, selling, and offering for sale the products that infringe upon the invention patent rights of the plaintiff, entitled “Resistor Device and Manufacturing Method Thereof,” with patent number ZL201410058473.7. Additionally, the defendant is ordered to destroy any infringing products in their inventory.

For more information regarding this case, please search https://wenshu.court.gov.cn/

More Recent Posts

Chroma Unveils Next-Generation Bidirectional DC Power Supplies: 45kW @ 4U High Power Density and 8x Wide-Range Output

In an industry-first, the 62450D-2000HL enables one-key switching between two output ranges within a single unit, effectively providing the output range of two units in one. Users can easily switch between the high voltage (2000V/±60A/±45kW) and high current (650V/±180A/±45kW) range with a single touch, offering up to 8x wider output range capabilities to meet the testing needs of a diverse array of devices under test (DUT).

Read More »